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篇目详细内容 |
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【篇名】 |
Review of near-field optical microscopy |
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【刊名】 |
Frontiers of Physics in China |
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【刊名缩写】 |
Front. Phys. China |
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【ISSN】 |
1673-3487 |
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【EISSN】 |
1673-3606 |
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【DOI】 |
10.1007/s11467-006-0027-7 |
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【出版社】 |
Higher Education Press and Springer-Verlag |
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【出版年】 |
2006 |
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【卷期】 |
1
卷3期 |
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【页码】 |
263-274
页,共
12
页 |
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【作者】 |
WU Shi-fa;
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【关键词】 |
near-field optical microscope (NOM); atomic force microscope combined with photon scanning tunneling optical microscope (AF / PSTM); SNOM |
【摘要】 |
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This review has introduced a new near-field optical microscope (NOM)—atomic force microscope combined with photon scanning tunneling microscope (AF/PSTM). During scanning, AF/PSTM could get two optical images of refractive index image and transmissivity image, and two AFM images of topography image and phase image. A reflected near-field optical microscope (AF/RSNOM ) has also been developed on AF/PSTM platform. The NOM has been reviewed in this paper and the comparison between AF/PSTM & RSNOM and the commercial A-SNOM & RNOM has also been discussed. The functions of AF/PSTM & RSNOM are much better than A-SNOM & RNOM. |
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