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篇目详细内容

【篇名】 Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure
【刊名】 Frontiers of Optoelectronics in China
【刊名缩写】 Front. Optoelectron. China
【ISSN】 1674-4128
【EISSN】 1674-4594
【DOI】 10.1007/s12200-011-0171-8
【出版社】 Higher Education Press and Springer-Verlag Berlin Heidelberg
【出版年】 2011
【卷期】 4 卷4期
【页码】 378-381 页,共 4 页
【作者】 Yueyin SHAO; Yongqian WEI; Zhenghua WANG;
【关键词】 surface-enhanced Raman scattering (SERS); silicon nanowires (SiNWs); Ag nanoparticles; sulfate ions

【摘要】
Silicon nanowires (SiNWs) with tens of micrometer in length have been synthesized and modified with Ag nanoparticles, which were confirmed by X-ray diffractometer (XRD), scanning electron microscopy and transmission electron microscopy. The Ag/Si nanostructure was employed to detect inorganic ions via surface-enhanced Raman scattering (SERS) with strong signals at low concentrations of 1×10?9?mol/L. This ultrasensitive method might be applied in other fields.
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